Dr. Yutaka Ohno (大野 裕)
Institute for Materials Research, Tohoku University Narita 2145-2, Oarai 311-1313, Japan
Phone： 029-267-3181, Fax： 029-267-4947
My focus is on multiscale analyses of GB functions in semiconductors by multimodal techniques including atom probe tomography, STEM, in-situ optical measurements (CL, PL, SNOM) under TEM, and ab-initio calculations.
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